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10 Productos
| Imagen | Modelo | Precio | Cantidad | Existencias | Fabricant | Descripción | Series | Part Status | Packaging | Operating Temperature | Mounting Type | Package / Case | Supplier Device Package | Supply Voltage | Number of Bits | Logic Type | |
|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|
|
|
Ver |
3,699
Tenemos efectivo.
|
Texas Instruments | IC SCAN-PATH LINKER 28-SOIC | 74ACT | Active | Tube | 0°C ~ 70°C | Surface Mount | 28-SOIC (0.295", 7.50mm Width) | 28-SOIC | 4.5 V ~ 5.5 V | 4 | SCAN-PATH LINKERS | ||
|
|
|
Ver |
2,194
Tenemos efectivo.
|
Texas Instruments | IC SCAN-PATH LINKER 28-SOIC | 74ACT | Active | Tape & Reel (TR) | 0°C ~ 70°C | Surface Mount | 28-SOIC (0.295", 7.50mm Width) | 28-SOIC | 4.5 V ~ 5.5 V | 4 | SCAN-PATH LINKERS | ||
|
|
|
Ver |
3,543
Tenemos efectivo.
|
Texas Instruments | IC SCAN TEST DEVICE 28-SOIC | 74ABT | Active | Tube | -40°C ~ 85°C | Surface Mount | 28-SOIC (0.295", 7.50mm Width) | 28-SOIC | 4.5 V ~ 5.5 V | 8 | Scan Test Device with Bus Transceiver and Registers | ||
|
|
|
Ver |
3,690
Tenemos efectivo.
|
Texas Instruments | IC SCAN TEST DEV/TXRX 28-SOIC | 74ABT | Active | Tube | -40°C ~ 85°C | Surface Mount | 28-SOIC (0.295", 7.50mm Width) | 28-SOIC | 4.5 V ~ 5.5 V | 8 | Scan Test Device with Registered Bus Transceiver | ||
|
|
|
Ver |
3,330
Tenemos efectivo.
|
Texas Instruments | IC SCAN-TEST-DEV/XCVR 28-SOIC | 74ABT | Active | Tube | -40°C ~ 85°C | Surface Mount | 28-SOIC (0.295", 7.50mm Width) | 28-SOIC | 4.5 V ~ 5.5 V | 8 | Scan Test Device with Bus Transceiver and Registers | ||
|
|
|
Ver |
3,699
Tenemos efectivo.
|
Texas Instruments | IC SCAN-PATH LINKER 28-SOIC | 74ACT | Active | Tube | 0°C ~ 70°C | Surface Mount | 28-SOIC (0.295", 7.50mm Width) | 28-SOIC | 4.5 V ~ 5.5 V | 4 | SCAN-PATH LINKERS | ||
|
|
|
Ver |
2,194
Tenemos efectivo.
|
Texas Instruments | IC SCAN-PATH LINKER 28-SOIC | 74ACT | Active | Tape & Reel (TR) | 0°C ~ 70°C | Surface Mount | 28-SOIC (0.295", 7.50mm Width) | 28-SOIC | 4.5 V ~ 5.5 V | 4 | SCAN-PATH LINKERS | ||
|
|
|
Ver |
3,543
Tenemos efectivo.
|
Texas Instruments | IC SCAN TEST DEVICE 28-SOIC | 74ABT | Active | Tube | -40°C ~ 85°C | Surface Mount | 28-SOIC (0.295", 7.50mm Width) | 28-SOIC | 4.5 V ~ 5.5 V | 8 | Scan Test Device with Bus Transceiver and Registers | ||
|
|
|
Ver |
3,690
Tenemos efectivo.
|
Texas Instruments | IC SCAN TEST DEV/TXRX 28-SOIC | 74ABT | Active | Tube | -40°C ~ 85°C | Surface Mount | 28-SOIC (0.295", 7.50mm Width) | 28-SOIC | 4.5 V ~ 5.5 V | 8 | Scan Test Device with Registered Bus Transceiver | ||
|
|
|
Ver |
3,330
Tenemos efectivo.
|
Texas Instruments | IC SCAN-TEST-DEV/XCVR 28-SOIC | 74ABT | Active | Tube | -40°C ~ 85°C | Surface Mount | 28-SOIC (0.295", 7.50mm Width) | 28-SOIC | 4.5 V ~ 5.5 V | 8 | Scan Test Device with Bus Transceiver and Registers |
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